Measurements of Residual Stresses in Micron Regions by Using Synchrotron Exited Kossel Diffraction
자료유형 | 해외논문 |
---|---|
저널명 | Measurements of Residual Stresses in Micron Regions by Using Synchrotron Exited Kossel Diffraction |
등록번호 | B0503401005 |
저자 | J. Brechbuhl, J. Bauch, H.-J. Ullrich |
연도 | 1999 |
권/호 | 034/01 |
페이지 | 59 ~ 70 |
키워드 | Residual Stress,Synchrotron Exited Kossel Diffraction,Kossel technique |
원문링크 | 원문링크 |
유형별 논문
J. Brechbuhl, J. Bauch, H.-J. Ullrich. (1999). Measurements of Residual Stresses in Micron Regions by Using Synchrotron Exited Kossel Diffraction.