Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS
자료유형 | 해외논문 |
---|---|
저널명 | Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS |
등록번호 | B0307001014 |
저자 | A. Boulton, D. Fornasiero and J. Ralston |
연도 | 2003 |
권/호 | 070/01 |
페이지 | 205 ~ 219 |
키워드 | selective flotation; sphalerite; pyrite; X-ray Photoelectron Spectroscopy; Time of Flight Secondary Ion Mass Spectroscopy |
원문링크 | 원문링크 |
유형별 논문
A. Boulton, D. Fornasiero and J. Ralston. (2003). Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS.